UTC RAVE Alert

Extreme Environment Technologies

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Photo of Daniel Loveless

Thomas (Daniel) Loveless

PhD

UC Foundation Associate Professor


 [email protected]

EMCS 337

 423-425-2353

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A two-dimensional (2D) spatial map of the regions within an integrated circuit that are sensitive to radiation-induced transient anomalies.
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A two-dimensional (2D) spatial map of the regions within an integrated circuit that are sensitive to radiation-induced transient anomalies. Data were captured at the Naval Research Laboratory.

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Example IRES spectral images showing statistical properties of the radiation-induced transient anomalies. The statistical properties are used for training machine-learning algorithms for automated identification of the faults.
UTC Image Caption

Example IRES spectral images showing statistical properties of the radiation-induced transient anomalies. The statistical properties are used for training machine-learning algorithms for automated identification of the faults.

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Department Hours
Monday - Friday: 8:00 am-5:00 pm