Cadence University Program

The Electrical Engineering Department at the University of Tennessee is a member of the Cadence Design Systems' university program which is designed to facilitate the use of Cadence Design Systems tools by undergraduate and graduate students in engineering courses and in academic research.

ENEE Courses:

• ENEE 3770: Advanced Electronics
  • Undergraduate course focused on the design of practical integrated operational amplifier circuits, advanced frequency domain concepts, and negative feedback systems.
  • The culminating design project is to design and simulate, using Cadence Design Systems tools, a CMOS operational amplifier circuit in the ON Semiconductor’s C5F/N 0.5 μm process.
• ENEE 4999: VLSI Design
  • Undergraduate special topics course focused on very-large-scale integration (VLSI) of circuit technologies. The Cadence Design Systems Virtuoso layout editor is used the course.
• ENEE 4999R: Radiation Effects and Reliability
  • Undergraduate special topics course focused on the effects of space radiation on the performance of microelectronics technologies. The Cadence Design Systems Virtuoso layout editor, the Analog Design Environment, and the Spectre circuit simulator are used in this course.
• ENEE 5910: VLSI Design
  • Graduate level course focused on very-large-scale integration (VLSI) of circuit technologies. The Cadence Design Systems Virtuoso layout editor is used the course.
• ENEE 5910: Advanced Electronics and Integrated Circuits
  • Graduate level course in advanced integrated circuit technologies.

Research Projects:

Faculty and students in the Electrical Engineering Department use Cadence Design Systems tools in their research. Cadence Design Systems tools are used for the design, simulation, and layout of analog, digital, and mixed-signal circuits for microelectronics and embedded systems design and extreme environment design.

Recent Publications (2015-2020) Utilizing Cadence Design Systems Tools :

• E. W. Richards, T. D. Loveless, J. S. Kauppila, T. D. Haeffner, W. T. Holman and L. W. Massengill, "Radiation Hardened by Design Subsampling Phase-Locked Loop Techniques in PD-SOI," IEEE Trans. Nucl. Sci., vol. 67, no. 6, pp. 1144-1151, June 2020, doi: 10.1109/TNS.2020.2978167
• A. J. Wilson, D. R. Reising, R. W. Hay, R. C. Johnson, A. A. Karrar and T. D. Loveless, "Automated Identification of Electrical Disturbance Waveforms within an Operational Smart Power Grid," IEEE Trans. Smart Grid, Apr. 2020, doi: 10.1109/TSG.2020.2990079.
• T. D. Loveless, B. Patel, D. R. Reising, R. Roca, M. Allen, L. W. Massengill, and D. McMorrow, "Ionizing Radiation Effects Spectroscopy for Analysis of Single Event Transients," IEEE Trans. Nucl. Sci.,vol. 67, no. 1, pp. 99-107, Jan. 2020, doi: 10.1109/TNS.2019.2950385
• M. K. M. Fadul, D. R. Reising, T. D. Loveless and A. R. Ofoli, "RF-DNA Fingerprint Classification of OFDM Signals Using a Rayleigh Fading Channel Model," 2019 IEEE Wireless Communications and Networking Conference (WCNC), pp. 1-7, 2019.
  doi: 10.1109/WCNC.2019.8885421
• B. Patel, M. Joplin, R. C. Boggs, D. R. Reising, M. W. McCurdy, L. W. Massengill, T. D. Loveless, "Ionizing Radiation Effects Spectroscopy (IRES) for Analysis of Total-Ionizing Dose Degradation in RF Circuits," IEEE Trans. Nucl. Sci., vol. 66, no. 1, pp. 61-68, Jan. 2019.
• Y. P. Chen, L. W. Massengill, A. L. Sternberg, E. X. Zhang, J. S. Kauppila, M. Yao, A. L. Amort, B. L. Bhuva, W. T. Holman, and T. D. Loveless, “Time-Domain Modeling of All-Digital PLLs (ADPLLs) to Single-Event Upset (SEU) Perturbations,” IEEE Trans. Nucl. Sci., vol. 65, no. 1, pp. 311-317, Jan. 2018.
• R. C. Harrington, J. S. Kauppila, K. M. Warren, *Y. P. Chen, *J. A. Maharrey, T. D. Haeffner, T. D. Loveless, B. L. Bhuva, M. Bounasser, K. Lilja, and L. W. Massengill, “Estimating Single-Event Logic Cross Sections in Advanced Technologies,” IEEE Trans. Nucl. Sci., vol. 64, no. 8, pp. 2115-2121, Aug. 2017.
• Y. P. Chen, L. W. Massengill, J. S. Kauppila, B. L. Bhuva, W. T. Holman, and T. D. Loveless, “Single-Event Characterization of Common 1st and 2nd-Order All-Digital Phase-Locked Loops (ADPLLs),” IEEE Trans. Nucl. Sci., vol. 64, no. 8, pp. 2144-2151, Aug. 2017.
• T. D. Loveless, S. Jagannathan, E. X. Zhang, D. Fleetwood, J. Kauppila, L. W. Massengill, “Combined Effects of Total Ionizing Dose and Temperature on a K-band Quadrature LC-Tank VCO in a 32 nm CMOS SOI Technology,” IEEE Trans. Nucl. Sci., vol. 64, no. 1, pp. 204-211, Jan. 2017.
• Y P. Chen, T. D. Loveless, A. L. Sternberg, E. X. Zhang, J. S. Kauppila, B. L. Bhuva, W. T. Holman, M. L. Alles, R. A. Reed, R. D. Schrimpf, D. McMorrow, and L. W. Massengill, “Persistent Laser-Induced Leakage in a 20 nm Charge-Pump Phase-Locked Loop (PLL),” IEEE Trans. Nucl. Sci., vol. 64, no. 1, pp. 512-518, Jan. 2017.
• Y. P. Chen, L. W. Massengill, B. L. Bhuva, W. T. Holman, J. S. Kauppila, and T. D. Loveless, “Single-Event Characterization of 1st and 2nd-order Linear and Bang-bang All-digital Phase-locked Loops (ADPLLs),” proceedings of the 2016 IEEE Radiation Effects on Components & Systems Conference (RADECS), Bremen, Germany, Sept. 2016.
• S. Jagannathan, N. Mahatme, T. D. Loveless, B. L. Bhuva, and L. W. Massengill, “Hardware Based Empirical Model for Predicting Logic Soft Error Cross-Section,” proceedings of the 2016 IEEE International Reliability Physics Symposium (IRPS), Pasadena, CA, Apr. 2016.
• J. S. Kauppila, T. D. Loveless, T. Haeffner, A. L. Sternberg, D. R. Ball, J. Rowe, T. Assis, H. Jiang, H. Zhang, B. L. Bhuva, M. L. Alles, and L.W. Massengill, “14/16nm FinFET Radiation Response Characterization,” proceedings of the Government Microcircuits Applications and Critical Technology Conference (GOMACTech), Orlando, FL, March, 2016.
• Y. P. Chen, L. W. Massengill, B. L. Bhuva, W. T. Holman, T. D. Loveless, W. H. Robinson, N. J. Gaspard, and A. F. Witulski, “Single-Event Characterization of Bang-Bang All-Digital Phase-Locked Loops (ADPLLs),” IEEE Trans. Nucl. Sci., vol. 62, no. 6, pp. 2650-2656, Dec. 2015.
• K. J. Shetler, N. M. Atkinson, W. T. Holman, J. S. Kauppila, T. D. Loveless, A. F. Witulski, B. L. Bhuva, E. X. Zhang, and L. W. Massengill, “Radiation Hardening of Voltage References Using Chopper Stabilization,” IEEE Trans. Nucl. Sci., vol. 62, no. 6, pp. 3064-3071, Dec. 2015.
• J. S. Kauppila, L. W. Massengill, D. R. Ball, M. L. Alles, R. D. Schrimpf, T. D. Loveless, J. Maharrey, R. C. Quinn, J. D. Rowe, “Geometry-Aware Single-Event Enabled Compact Models for Sub-50 nm Partially Depleted Silicon-on-Insulator Technologies,” IEEE Trans. Nucl. Sci., vol. 62, no. 4, pp. 1589-1598, Aug. 2015.
• J. Kauppila, J. Maharrey, R. Quinn, T. D. Loveless, T. Haeffner, J. Rowe, D. Ball, M. Alles, and L. Massengill, “Single-Event Measurements and Modeling in 32 nm SOI CMOS,” proceedings of the Government Microcircuits Applications and Critical Technology Conference (GOMACTech), St. Louis, MO, March, 2015.  

 Recent Presentations (2015-2020) Utilizing Cadence Design Systems Tools :

• "Phase-Modulated Local Oscillator Effects on RF-DNA Fingerprints in IEEE 802.11a Wi-Fi Signals," by *William Mitchell, *Kaitlin Hall, *Ahmed Ibrahim, Donald Reising, and Thomas Daniel Loveless, presented at the APS Match Meeting, Denver, CO, C71,00.10, Mar. 2020.
• E. W. Richards, J. S. Kauppila, T. D. Haeffner, W. T. Holman, L. W. Massengill, and T. D. Loveless, “Mitigating False-Edge Induced Loss-of-Lock Errors in Dual-Loop Phase-Locked Loops,” proceedings of the Government Microcircuits Applications and Critical Technology Conference (GOMACTech), San Diego, CA, Mar. 2020.
• “A CubeSat Reaction Wheel-Based Attitude Control System,” by Dean, D. Amaro, M. Bushra, M. E. Loveless, L. Elliott, and T. D. Loveless, presented at the 2020 Posters at the Capital, Nashville, TN, Feb. 2020.
• "Integration of Matched Filtering within the RF-DNA Fingerprinting Process," by *Aaron Wilson, Donald R Reising, T. Daniel Loveless, presented at the IEEE Global Communications Conference, Waikoloa, H, Dec. 2019.
• “Electrical-Based Screening of Radiation Failure Modes in Transistor-Based Memory for Space Application," by *J. Cannon, *R. Estrada, *R. Boggs, D. R. Reising, and T. D. Loveless, presented at the 2019 CUR REU Symposium, Alexandria, VA, Oct. 2019.
• "Ionizing Radiation Effects Spectroscopy for Analysis of Single Event Transients in RF Circuits," by T. D. Loveless, *B. Patel, D. R. Reising, R. Roca*, M. Allen*, L. W. Massengill, and D. McMorrow, presented at the IEEE Nuclear and Space Radiation Effects Conference (NSREC), San Antonio, TX, July 2019.
• "RHBD Techniques for a Sub-Sampling Phase-Locked Loop in 32nm PD-SOI," by 

  *E. W. Richards, J. S. Kauppila, T. D. Haeffner, W. T. Holman, L. W. Massengill, and T. D. Loveless, presented at the IEEE Nuclear and Space Radiation Effects Conference (NSREC), San Antonio, TX, July 2019. 

• "RF-DNA Fingerprint Classification of OFDM Signals Using a Rayleigh Fading Channel Model," by *M. K. M. Fadul, D. R. Reising, T. D. Loveless and A. R. Ofoli,  presented in 2019 IEEE Wireless Communications and Networking Conference (WCNC), Marrakesh, Morocco, 2019.
• "Mitigating False-Edge Induced Loss-of-Lock Errors in Dual-Loop Phase-Locked Loops," by *E. W. Richards, J. S. Kauppila, T. D. Haeffner, W. T. Holman, L. W. Massengill, and T. D. Loveless, presented at the Government Microcircuits Applications and Critical Technology Conference (GOMACTech), Albuquerque, NM, March, 2019.
• "Ionizing Radiation Effects Spectroscopy (IRES) for Analysis of Total Ionizing Dose Degradation in Voltage-Controlled Oscillators,” by B. P. Patel, M. Joplin, R. Boggs, D. Reising, M. W. McCurdy, L. W. Massengill, and T. D. Loveless, presented at the IEEE Nuclear and Space Radiation Effects Conference (NSREC), Kona, HI, PA-3, July 2018.
• “Space Systems Engineering in Undergraduate Education,” by T. D. Loveless, proceedings of the 2018 ASEE-SE Conference, Daytona Beach, FL, pp. 109.1-109.9, Mar. 2018.
• INVITED “Hardening-By-Design Techniques for Analog and Mixed-Signal ASICs,” by D. Loveless, presented at the 12th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA), Montreal, Quebec, Canada, Nov. 2016.
• “A Single-Event Transient Measurement Payload for a 1U CubeSat,” by M. B. Joplin, T. D. Loveless, J. S. Kauppila, and L. W. Massengill, presented at the 2016 Single-Event Effects Symposium, La Jolla, CA, May 2016.
• INVITED “Radiation Effects and Basic Mitigation Techniques for Mixed-Signal Electronics,” by T. D. Loveless, presented at the 2016 Hardened Electronics and Radiation Technology (HEART) Conference, Monterey, CA, Apr. 2016.
• INVITED “Hardening-By-Design Techniques for Analog and Mixed-Signal ASICs,” by D. Loveless, presented at the 11th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA), Puebla, Mexico, Dec. 2015.

Faculty Contact:	Administrative Contact:
Dr. Daniel Loveless	Karl Fletcher
Phone: 423-425-2353	Phone: 423-425-4306
E-mail: [email protected]	E-mail: [email protected]

 

Links:

Cadence University Program Cadence Newsletters

Last Updated: 10/7/2020

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